Our latest subsampling microscopy technique significantly reduces beam damage, increases image quality and speeds up the imaging process 10x.
SenseAI subsampling & image processing takes failure analysis in the semicon industry to a different level.
Superfast, low-dose Electron Microscopy in the semicon industry
Designed for imaging in semiconductor manufacturing
SenseAI was born from the challenges in electron microscopy and other high-performance analytical techniques in the semiconductor industry.
In particular, SenseAI has a transformational effect on speeding up the following for electron microscopy in the semicon industry:
- Low-dose STEM
- Fast Ptychography
- Adaptive FIB-SEM tomography
- Efficient STEM simulations
- Rapid EBSD and EDS
- EELS
- SEM