Our post-processing software suite can be applied to images after their acquisition. SenseAI Enhance can an be used stand-alone or alongside SenseAI Accelerate.
Electron microscopy often involves compromise: lower dose to protect the sample, faster scans to increase throughput, or noisy images when signal is limited.
SenseAI Enhance improves clarity, reduces noise and restores fine structural detail while preserving features that matter scientifically – all post acquisition. Unlike generic denoising or sharpening tools, SenseAI Enhance is developed for microscopy data, where oversmoothing, artifacts, and loss of subtle structure can change interpretation.
Use it to improve:
- Low-dose and beam-sensitive datasets
- Fast scans and reduced dwell-time acquisitions
- Noisy or low-contrast images
- Fine interfaces, particles and structural features
- Images used for segmentation, measurement or publication
- Existing datasets that were difficult to analyse first time round
Machine learning algorithms, including dictionary learning and filters, to resolve underlying structures and noise
Deconvolution resolving a point spread function with other techniques
Resolve different frequency signals to clarify certain information
- TEM / STEM imaging including in-situ and high-speed imaging
- 4D STEM datasets
- SEM including volume EM
- Light microscopy including confocal, high throughput screening and other techniques
- Defect detection
- Interface analysis
- Nanostructure characterisation
- Failure analysis
- Process control
- Inline inspection workflows
- Microstructure clarity
- Degradation analysis
- Phase identification
- Cellular ultrastructure
- Single Particle Analysis using TEM
- Connectomics
- High-content imaging pipelines including high-throughput screening