Expo Hours
August 2-6 2026:
Monday: 12pm – 5:30pm
Tuesday: 10am – 5:30pm
Wednesday: 10am – 5:30pm
Thursday: 10am – 2pm
Location
Booth #336
Baird Center in Milwaukee, WI
Explore Superfast, Low dose, Low data Imaging & Subsampling for Electron Microscopy
SenseAI is excited to announce our participation at M&M 2026! Here’s what we’ve got lined up for you!
VENDOR TUTORIALS
Improving acquisition speeds and reducing beam damage in Volume EM
Monday August 3rd
17.45-18.45
At booth #336
Volume imaging techniques in electron microscopy operate by collecting images from sequential serial sections which are then assembled through post-acquisition processing to generate final 3D volume reconstructions. The overall volume that can be included in the final reconstruction is dependent on the uniformity of the sample and the ability of the microscope to image it. This process itself, however, is largely limited by the time to acquire the images and the sample and microscope stability during acquisition. |
In this tutorial, SenseAI will demonstrate how their compressed sensing software significantly reduces each of these effects and the improvements in resolution that are possible – widening the versatility and utility of Volume EM. |
Live 4D STEM Imaging
Tuesday August 4th
17.45-18.45
At booth #336
4D Scanning Transmission Electron Microscopy (4D-STEM) has long been regarded as one of the most powerful but challenging techniques in electron microscopy. Historically, its adoption and success has been limited by complex workflows, instability (drift), beam damage, slow frame rates, vast data sizes, and a lack of pre-acquisition surveying. |
In this tutorial, you’ll explore how SenseAI’s 4D STEM solution changes this paradigm by dramatically streamlining the entire process—from alignment through to analysis. |
Faster, lower dose mapping by Compressive EDS
Wednesday August 5th
17.45-18.45
At booth #336
Energy dispersive x-ray spectroscopy (EDS) is one of the most commonly used microanalysis techniques used in materials science. The major downside to EDS is the time of acquisition, operating on several orders of magnitude slower than regular SEM or STEM imaging. Techniques for increasing the acquisition speed of EDS would have great potential in almost all applications, and compressed sensing is proposed as a solution. |
In this tutorial, we’ll demonstrate how a compressed sensing technique, comprising subsampling and inpainting, greatly increases the accuracy of analysis over traditional fast scanning. |
Explore SenseAI more at M&M
Poster: Compressed Sensing Methods for Nanobeam 4D-STEM
by Alex Robinson, Monday 15:00-17:30
Category: Featured Syposium
A09.P1 Multi-dimensional and Multi-scale Imaging and Advanced Data Processing - Novel Opportunities in Material Science
Talk: Reducing Beam Damage in Cryo Volume Scanning Electron Microscopy Through Compressive Sensing
by Alex Robinson, Tuesday 09:45-10:00 Biological Sciences Symposia B01.2 3D Structures: from Macromolecular Assemblies to Whole Cells (3DEM FIG) Location: S101 C
Talk: Enhanced feature resolution in STEM images using Dictionary Learning
by Alex Robinson, Tuesday 14:30-14:45
Cross-Disciplinary Symposia
C06.4 Automation in Microscopy from Image Acquisition to Image Analysis, Data Visualization, and Management
Location: S201 D
Talk: Accelerating desktop imaging with compressive sensing for wide field-of-view imaging
by Alex Robinson, Tuesday 09:15-09:30
Analytical Sciences Symposia
C08.1 Vendor Symposia
Location: S103 A
Talk: Faster Lower Dose Mapping by Compressive EDS
by Alex Robinson, Wednesday 08:45-09:00 Analytical Sciences Symposia A06.4 Correlative, Multimodal Microscopy, Spectroscopy, and Imaging Location: S202 B
Talk: Dictionary Learning and Transfer Methods to Enhance Resolution and Contrast in Atomic Resolution Secondary Electron Images
by Alex Robinson, Wednesay 09:15-09:30
Physical Sciences Symposia
P05.5 Advances in Electron Microscopy for Defect and Crystallographic Structure Analysis
Location: S102 C
Talk: Live Image Reconstruction to Increase Acquisition Speed and Dose Efficiency while Optimizing Data Content in Compressed (S)(T)EM
by Nigel Browning, Wednesday 10:30-10:45
Analytical Sciences Symposia
A10.5 Recent developments and new emergent applications in hardware, accessories and software tools
Location: S202 D
Poster: Exploring Compressive Sensing in 4D-STEM Cryo-ET and FIB for Structural Biology
by Alex Williams & New York Structural Biology Center, United States, Wednesday 15:00-17:30
Biological Sciences Symposia
B04.P1 Technical Advances and Transformative Applications of CryoEM.
Can't attend M&M?
If you’re not visiting M&M this year get in touch anyway to arrange a free demo or find out more.