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Publications

SenseAI has been published in a wide variety of Microscopy, Science and Industry publications and papers. Copies of any of the following are available on request.

 

2025

Moshtaghpour, Amirafshar; Velazco-Torrejon, Abner; Nicholls, Daniel; Robinson, Alex W; Kirkland, Angus I; Browning, Nigel D

Diffusion distribution model for damage mitigation in scanning transmission electron microscopy Journal Article

In: Journal of Microscopy, vol. 297, no. 1, pp. 57–77, 2025.

BibTeX

Broad, Zoë; Robinson, Alex W; Wells, Jack; Nicholls, Daniel; Moshtaghpour, Amirafshar; Kirkland, Angus I; Browning, Nigel D

Compressive electron backscatter diffraction imaging Journal Article

In: Journal of microscopy, 2025.

BibTeX

2024

Robinson, Alex W; Moshtaghpour, Amirafshar; Wells, Jack; Nicholls, Daniel; Chi, Miaofang; MacLaren, Ian; Kirkland, Angus I; Browning, Nigel D

High-speed 4-dimensional scanning transmission electron microscopy using compressive sensing techniques Journal Article

In: Journal of Microscopy, vol. 295, no. 3, pp. 278–286, 2024.

BibTeX

Nicholls, Daniel; Kobylynska, Maryna; Broad, Zoë; Wells, Jack; Robinson, Alex; McGrouther, Damien; Moshtaghpour, Amirafshar; Kirkland, Angus I; Fleck, Roland A; Browning, Nigel D

The potential of subsampling and inpainting for fast low-dose cryo fib-sem imaging Journal Article

In: Microscopy and Microanalysis, vol. 30, no. 1, pp. 96–102, 2024.

BibTeX

Robinson, AW; Wells, J; Moshtaghpour, A; Nicholls, D; Huang, C; Velazco-Torrejon, A; Nicotra, G; Kirkland, AI; Browning, ND

Real-time four-dimensional scanning transmission electron microscopy through sparse sampling Journal Article

In: Chinese Physics B, vol. 33, no. 11, pp. 116804, 2024.

BibTeX

2023

Nicholls, Daniel; Wells, Jack; Robinson, Alex W; Moshtaghpour, Amirafshar; Kirkland, Angus I; Browning, Nigel D

Scan coil dynamics simulation for subsampled scanning transmission electron microscopy Journal Article

In: arXiv preprint arXiv:2307.08441, 2023.

BibTeX

Nicholls, Daniel; Wells, Jack; Robinson, Alex W; Moshtaghpour, Amirafshar; Kobylynska, Maryna; Fleck, Roland A; Kirkland, Angus I; Browning, Nigel D

A targeted sampling strategy for compressive cryo focused ion beam scanning electron microscopy Proceedings Article

In: ICASSP 2023-2023 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), pp. 1–5, IEEE 2023.

BibTeX

Nicholls, Daniel

Compressive Sensing Methods and Applications for Electron Microscopy PhD Thesis

The University of Liverpool (United Kingdom), 2023.

BibTeX

Browning, Nigel D; Castagna, Jony; Kirkland, Angus I; Moshtaghpour, Amirafshar; Nicholls, Daniel; Robinson, Alex W; Wells, Jack; Zheng, Yalin

The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy Journal Article

In: Applied Physics Letters, vol. 122, no. 5, 2023.

BibTeX

Nicholls, Daniel; Wells, Jack; Robinson, Alex W; Moshtaghpour, Amirafshar; Kobylynska, Maryna; Fleck, Roland A; Kirkland, Angus I; Mehdi, B Layla; Browning, Nigel D

Compressive Cryo FIB-SEM Tomography Miscellaneous

2023.

BibTeX

Broad, Zoë; Nicholls, Daniel; Wells, Jack; Moshtaghpour, Amirafshar; Robinson, Alex W; Masters, Robert; Hughes, Louise; Browning, Nigel D

Subsampling methods for fast electron backscattered diffraction analysis for SEM Miscellaneous

2023.

BibTeX

Wells, Jack; Moshtaghpour, Amirafshar; Nicholls, Daniel; Robinson, Alex W; Zheng, Yalin; Castagna, Jony; Browning, Nigel D

SenseAI: Real-Time Inpainting for Electron Microscopy Journal Article

In: arXiv preprint arXiv:2311.15061, 2023.

BibTeX

Robinson, Alex W; Wells, Jack; Nicholls, Daniel; Moshtaghpour, Amirafshar; Chi, Miaofang; Kirkland, Angus I; Browning, Nigel D

Towards real-time STEM simulations through targeted subsampling strategies Journal Article

In: Journal of microscopy, vol. 290, no. 1, pp. 53–66, 2023.

BibTeX

2022

Nicholls, Daniel; Robinson, Alex; Wells, Jack; Moshtaghpour, Amirafshar; Bahri, Mounib; Kirkland, Angus; Browning, Nigel

Compressive scanning transmission electron microscopy Proceedings Article

In: ICASSP 2022-2022 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), pp. 1586–1590, IEEE 2022.

BibTeX

Nicholls, Daniel; Wells, Jack; Stevens, Andrew; Zheng, Yalin; Castagna, Jony; Browning, Nigel D

Sub-sampled imaging for STEM: Maximising image speed, resolution and precision through reconstruction parameter refinement Journal Article

In: Ultramicroscopy, vol. 233, pp. 113451, 2022.

BibTeX

Browning, Nigel D; Mehdi, B Layla; Nicholls, Daniel; Stevens, Andrew

Using the Physics of Electron Beam Interactions to Determine Optimal Sampling and Image Reconstruction Strategies for High Resolution STEM Book Section

In: Knowledge Guided Machine Learning, pp. 233–260, Chapman and Hall/CRC, 2022.

BibTeX

Robinson, Alex W; Nicholls, Daniel; Wells, Jack; Moshtaghpour, Amirafshar; Kirkland, Angus; Browning, Nigel D

SIM-STEM Lab: Incorporating compressed sensing theory for fast STEM simulation Journal Article

In: Ultramicroscopy, vol. 242, pp. 113625, 2022.

BibTeX

2021

Lee, Juhan; Nicholls, Daniel; Browning, Nigel D; Mehdi, B Layla

Controlling radiolysis chemistry on the nanoscale in liquid cell scanning transmission electron microscopy Journal Article

In: Physical Chemistry Chemical Physics, vol. 23, no. 33, pp. 17766–17773, 2021.

BibTeX

Ortega, Eduardo; Nicholls, Daniel; Browning, Nigel D; Jonge, Niels

High temporal-resolution scanning transmission electron microscopy using sparse-serpentine scan pathways Journal Article

In: Scientific reports, vol. 11, no. 1, pp. 22722, 2021.

BibTeX

2020

Nicholls, Daniel; Lee, Juhan; Amari, Houari; Stevens, Andrew J; Mehdi, B Layla; Browning, Nigel D

Minimising damage in high resolution scanning transmission electron microscope images of nanoscale structures and processes Journal Article

In: Nanoscale, vol. 12, no. 41, pp. 21248–21254, 2020.

BibTeX

Nicholls, Daniel; Lee, Juhan; Amari, Houari; Stevens, Andrew; Layla, B Mehdi; Browning, Nigel

Distributing the Electron Dose to Minimise Electron Beam Damage in Scanning Transmission Electron Microscopy Journal Article

In: Microscopy and Microanalysis, vol. 26, no. S2, pp. 3070–3071, 2020.

BibTeX