Catch up: Volume Electron Microscopy (vEM) – How to speed up acquisition and enhance image quality Q&A with Professor Nigel Browning (University of Liverpool) and Professor Roland Fleck (King’s College London)
SenseAI presenting at APMC2025
The SenseAI team will be presenting serval workshops at the 13th Asia Pacific Microscopy Congress 2025 (APMC), Brisbane, Australia. If you’re there in person or online, here’s when you can catch us presenting: Monday AM – Efficient Sampling for Fast Low…
Publication: Compressive electron backscatter diffraction imaging
The latest paper featuring SenseAI has been published in the Journal of Microscopy. The study by Zoë Broad proposes a methodology for performing subsampled EBSD and the corresponding data recovery using SenseAI. The goal was to overcome the key limitation of…