Wednesday 15th May 2024, 16:00-16:30 BST (17:00 CEST, 11:00 EDT)

The latest in subsampling microscopy techniques can significantly reduce beam damage, increase image quality and speed up the imaging process 10x. In this webinar you will:

• Learn about the latest in subsampling & image processing for failure analysis in the semicon industry
• Hear how CNR-IMM used SenseAI to investigate the Projected Electrical Properties of 2-dimensional Electron Gas using 4-D STEM

At the end of the webinar, you will have the option to stay on and watch a live demonstration of the latest AI-driven, low-dose subsampling technology from SenseAI (30 mins).

Enter your details below and we will send you a joining link to the webinar a few days before the event. If you can’t attend for any reason we will send you a recording of the event and demo afterwards.