Why fast image capture in Electron Microscopy is so important and how can we image in real time The speed at which images are acquired – the acquisition speed – has a huge impact on the efficiency, and capability of Electron…
Publication: ScienceDirect – High-resolution TEM imaging of polymer crystals using 2D-class averaging methods
SenseAI has been published in ScienceDirect by Elsevier. Abstract High-resolution imaging of polymer crystals has so far been a challenge for transmission electron microscopy because of their high sensitivity to radiation. However, with the development of new camera systems, it is…
SenseAI win 2025 Innovation Award from Microscopy Today
We were presented with the prestigious award for innovation at M&M last week by Editor-in-Chief of Microscopy Today Dr. Robert Price. Each year Microscopy Today presents ten awards to organizations or individuals who have launched or published innovations in microscopy or microanalysis. Winning…
SenseAI launch Real Time 4D STEM Imaging
4D STEM nADF Negative Annular Dark Field Left (A): Subsampled layer using 25% of original data points. Right (B): Reconstruction using SenseAI. Total scan time is approximately 0.635 seconds. Generated from one 4D-STEM data set acquired by SenseAI Vision subsampling and…
Nanoscience Instruments becomes exclusive North American distributor for SenseAI
Nanoscience Instruments will be the sole North American sales and service provider of our electron microscopy imaging software. SenseAI is excited to announce a new exclusive distribution agreement with Nanoscience Instruments, leaders in microscopy and surface science instrumentation. The partnership will…
King’s College London unlocking cryo-bio VEM with SenseAI
Professor Roland Fleck, Director of the Centre for Ultrastructural Imaging talks about how they use SenseAI for faster, lower dose, lower data imaging. Challenges Sample Stability – the major challenges we’ve encountered really relate to sample stability. Our preference is to…
In the press: International Commercial Micro Manufacturing
SenseAI has been featured Commercial Micro Manufacturing. The publication and website serves a targeted global audience of micro, high-precision and MEMS engineers. The feature looked at how CNR-IMM (Istituto per la microelettronica e microsistemi) is using SenseAI to achieve a faster…
Presentation: Use of 3-D Data Volumes for Recovery of Subsampled EBSD Datasets
Zoe Broad recently presented on behalf of SenseAI at EBSD 2025 hosted by the Royal Microscopical Society. Zoë was presenting on the ‘Use of 3-D Data Volumes for Recovery of Subsampled EBSD Datasets’. As you can see from the presentation, Subsampled…
Publication: Compressive electron backscatter diffraction imaging
The latest paper featuring SenseAI has been published in the Journal of Microscopy. The study by Zoë Broad proposes a methodology for performing subsampled EBSD and the corresponding data recovery using SenseAI. The goal was to overcome the key limitation of…
Publication: Real-time four-dimensional scanning transmission electron microscopy through sparse sampling
We recently published a new article for the IOP Science Stephen J. Pennycook special issue. This paper demonstrates the first real time application of compressive sensing and inpainting for four dimensional STEM using SenseAI Innovations technology and was proudly done in…