Expo Hours
July 28 – July 31, 2025:
Monday: 12pm – 5:30pm
Tuesday: 10am – 5:30pm
Wednesday: 10am – 5:30pm
Thursday: 10am – 2pm
Location
Booth #1530
Salt Palace Convention Center
100 S W Temple St
Salt Lake City, UT 84101
Explore Superfast, Low dose, Low data Imaging & Subsampling for Electron Microscopy
SenseAI is excited to announce our participation at M&M 2025! Here’s what we’ve got lined up for you!
VENDOR TUTORIAL & PRODUCT LAUNCH
Real-time 4D STEM Imaging
Tuesday 29th July
17.45-18.45
At booth #1530
REGISTER
In 4D STEM, a detector captures a diffraction pattern at each probe position in the scan. As a result, the acquisition speed is limited by how quickly the detector can capture each frame, which is typically on the order of 10x to 100x slower than typical STEM imaging. This leads to smaller fields of view, increased beam damage potential, stage drift, and vast datasets.
In this tutorial, we will demonstrate a subsampled approach to 4D STEM from SenseAI, allowing real-time feedback.
Partner VENDOR TUTORIAL with Nanoscience Instruments
100pc Faster Imaging for Electron Microscopy
Monday 28th July
17.45-18.45
At booth #1925 (Nanoscience Instruments)
Introducing ‘compressed sensing’ software from SenseAI, for superfast sampling of a fraction of your image data without loss of any inherent information. SenseAI generates images up to 100x faster, resulting in significantly reduced beam damage, and most importantly, without loss of image integrity. We’ll discuss the limitations in current imaging techniques, from beam damage to slowness, complexity and poor results, and we’ll introduce the SenseAI software with a live demo.
Explore SenseAI more at M&M 2025
Poster: Advancing 4D STEM using Computational Techniques
by Alex Robinson
Thursday 31 July
Talk: Context informed Deep Convolutional Neural Networks for image denoising in STEM
by Alex Williams
Thursday 31 July 16:00-16.15
Talk: Feature enhancement during dictionary learning reconstructions of scanning transmission electron microscope images
by Richard Jinschek
Thursday 31 July 16:30-16:45
Book your demo slots now
NEW! LIVE 4D STEM IMAGING
Introducing our 4D STEM imaging software that enables microscopists to perform 4D STEM live, with significantly less beam exposure and less than 10% of the data.
INTRODUCTION TO SENSEAI
See our superfast imaging for electron microscopy in action. Up to 100x faster, 100x less data and 100x less dose. With SenseAI you can interpret your data in minutes, not weeks.
VOLUME SEM IMAGING
SenseAI works for volumetric analyses across all sample types and electron microscopes. Our live subsampling reduces charging effects and beam damage whilst using up to 100% less data.
Can't attend M&M?
If you’re not visiting M&M this year get in touch anyway to arrange a free demo or find out more.
