Explore Superfast, Low dose, Low data Imaging & Subsampling for Electron Microscopy at Booth #102
SenseAI is excited to announce our participation at Microscience Microscopy Congress 2025 (MMC) in Manchester, from July 1 to 3. Here’s what we’ve got lined up for you!
Book your demo slots now
NEW! LIVE 4D STEM IMAGING
Introducing our 4D STEM imaging software that enables microscopists to perform 4D STEM live, with significantly less beam exposure and less than 10% of the data.
INTRODUCTION TO SENSEAI
See our superfast imaging for electron microscopy in action. Up to 100x faster, 100x less data and 100x less dose. With SenseAI you can interpret your data in minutes, not weeks.
VOLUME SEM IMAGING
SenseAI works for volumetric analyses across all sample types and electron microscopes. Our live subsampling reduces charging effects and beam damage whilst using up to 100% less data.
Join our commercial workshop
Real-time 4D STEM Imaging
Wednesday 2 July
11.15-11.45am
In 4D STEM, a detector captures a diffraction pattern at each probe position in the scan. As a result, the acquisition speed is limited by how quickly the detector can capture each frame, which is typically on the order of 10x to 100x slower than typical STEM imaging. This leads to smaller fields of view, increased beam damage potential, stage drift, and vast datasets.
In this tutorial, we will demonstrate a subsampled approach to 4D STEM from SenseAI, allowing real-time feedback.
Join our LIVE demo on stand 102!
4D STEM Imaging
Wednesday 2 July
4pm
Just come along to stand 102 - no need to book.
Come and see our NEW live 4D STEM imaging in action ft real time material analysis from the grand arm of the University of Liverpool.
Explore SenseAI more at MMC 2025
Poster & Flash Talk: Inpainting for the Recovery of Low Dose EDS Datasets
1004 by Zoe Broad
Poster Session One
Tuesday 1 July 16:30-18:30
Flash Talk: 16.18
Poster: Accelerating Large Volume Electron Microscopy Through Sparse Sampling
1029 by Daniel Nicholls
Poster Session One
Tuesday 1 July 16:30-18:30
Poster & Flash Talk: Advancing 4D-STEM with Computational Techniques
2038 by Daniel Nicholls & Alex Robinson
Poster Session Two
Wednesday 2 July 16:15-18:15
Flash Talk: 12.00
Poster& Flash Talk: Feature Enhancement during Dictionary Learning Reconstructions of Scanning Transmission Electron Microscope Images
2023 by Richard Jinschek
Poster Session Two: Wednesday 2 July
Flash Talk: 16.09
Talk: Sparse Sampling and Four-dimensional Inpainting in EBSD Imaging
219 by Zoe Broad
Wednesday 2 July 15.15-15.30
Poster & Flash Talk: Accelerating Large Volume Electron Microscopy Through Sparse Sampling
2047 by Alex Williams
Poster Session Two
Wednesday 2 July 16:15-18:15
Flash Talk: 16.09
Talk: Cryo Volume Electron Microscopy (cvEM) a case for novel scan strategies
390 by Maryna Kobylynska
Thursday 3 July 11.15-11.30
Can't attend MMC?
If you’re not visiting MMC this year get in touch anyway to arrange a free demo or find out more.
