Contacts
Get in touch
senseai receive microscopy today innovation award 2025

SenseAI win 2025 Innovation Award from Microscopy Today

We were presented with the prestigious award for innovation at M&M last week by Editor-in-Chief of Microscopy Today Dr. Robert Price. Each year Microscopy Today presents ten awards to organizations or individuals who have launched or published innovations in microscopy or microanalysis. Winning…

Read More
mCOM_recon_viridis

SenseAI launch Real Time 4D STEM Imaging

4D STEM nADF Negative Annular Dark Field Left (A): Subsampled layer using 25% of original data points. Right (B): Reconstruction using SenseAI. Total scan time is approximately 0.635 seconds. Generated from one 4D-STEM data set acquired by SenseAI Vision subsampling and…

Read More
nanoscience partner senseai

Nanoscience Instruments becomes exclusive North American distributor for SenseAI

Nanoscience Instruments will be the sole North American sales and service provider of our electron microscopy imaging software. SenseAI is excited to announce a new exclusive distribution agreement with Nanoscience Instruments, leaders in microscopy and surface science instrumentation. The partnership will…

Read More
2560px-King's_College_London_logo electron microscopy.svg

King’s College London unlocking cryo-bio VEM with SenseAI

Professor Roland Fleck, Director of the Centre for Ultrastructural Imaging talks about how they use SenseAI for faster, lower dose, lower data imaging. Challenges Sample Stability – the major challenges we’ve encountered really relate to sample stability. Our preference is to…

Read More
imveurope-logo

In the press: Imaging and Machine Vision Europe

Imaging and Machine Vision Europe have featured our work with the CNR Institute for Microelectronics and Microsystems. The article highlights how CNR-IMM was able to subsample using just 10% of the original data, image in real time, make their data more…

Read More
CMM semicon microscopy

In the press: International Commercial Micro Manufacturing

SenseAI has been featured Commercial Micro Manufacturing. The publication and website serves a targeted global audience of micro, high-precision and MEMS engineers. The feature looked at how CNR-IMM (Istituto per la microelettronica e microsistemi) is using SenseAI to achieve a faster…

Read More
Use of 3-D Data Volumes for Recovery of Subsampled EBSD Datasets

Presentation: Use of 3-D Data Volumes for Recovery of Subsampled EBSD Datasets

Zoe Broad recently presented on behalf of SenseAI at EBSD 2025 hosted by the Royal Microscopical Society. Zoë was presenting on the ‘Use of 3-D Data Volumes for Recovery of Subsampled EBSD Datasets’. As you can see from the presentation, Subsampled…

Read More
APMC+2025+handle+banner+V2

SenseAI presenting at APMC2025

The SenseAI team will be presenting serval workshops at the 13th Asia Pacific Microscopy Congress 2025 (APMC), Brisbane, Australia. If you’re there in person or online, here’s when you can catch us presenting: Monday AM – Efficient Sampling for Fast Low…

Read More
Compressive electron backscatter diffraction imaging

Publication: Compressive electron backscatter diffraction imaging

The latest paper featuring SenseAI has been published in the Journal of Microscopy. The study by Zoë Broad proposes a methodology for performing subsampled EBSD and the corresponding data recovery using SenseAI. The goal was to overcome the key limitation of…

Read More
image (1)

Publication: Real-time four-dimensional scanning transmission electron microscopy through sparse sampling

We recently published a new article for the IOP Science Stephen J. Pennycook special issue. This paper demonstrates the first real time application of compressive sensing and inpainting for four dimensional STEM using SenseAI Innovations technology and was proudly done in…

Read More